Double-tilt in situ TEM holder with multiple electrical contacts and its application in MEMS-based mechanical testing of nanomaterials.

@article{Bernal2015DoubletiltIS,
  title={Double-tilt in situ TEM holder with multiple electrical contacts and its application in MEMS-based mechanical testing of nanomaterials.},
  author={Rodrigo A. Bernal and Rajaprakash Ramachandramoorthy and Horacio D Espinosa},
  journal={Ultramicroscopy},
  year={2015},
  volume={156},
  pages={23-8}
}
MEMS and other lab-on-a-chip systems are emerging as attractive alternatives to carry out experiments in situ the electron microscope. However, several electrical connections are usually required for operating these setups. Such connectivity is challenging inside the limited space of the TEM side-entry holder. Here, we design, implement and demonstrate a double-tilt TEM holder with capabilities for up to 9 electrical connections, operating in a high-resolution TEM. We describe the operating… CONTINUE READING