Double-sampling architectures

  title={Double-sampling architectures},
  author={Michael Nicolaidis},
  journal={2014 IEEE International Reliability Physics Symposium},
Aggressive technology scaling impacts dramatically parametric yield and reliability in advanced nanometric nodes, and can become showstoppers when moving deeper to the sub-10nm domain. To mitigate this issue various approaches have been proposed including increasing guard-bands, fault-tolerant design, and canary circuits. Each of these approaches have certain fundamental drawbacks such as: large performance penalty, and/or large area and power penalty, and/or false positives and false negatives… CONTINUE READING

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