Double-layer coating for high-resolution low-temperature scanning electron microscopy.

@article{Walther1995DoublelayerCF,
  title={Double-layer coating for high-resolution low-temperature scanning electron microscopy.},
  author={Paul Walther and Ernst Wehrli and Ren{\'e} Hermann and Martin Ludwig M{\"u}ller},
  journal={Journal of microscopy},
  year={1995},
  volume={179 Pt 3},
  pages={229-37}
}
Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in low-temperature scanning electron microscopy of bulk specimens. At high primary magnifications (e.g., 100,000 x) a hydrated sample is usually severely damaged after one slow scan (about 3000 e-nm-2). The consequences of this beam damage are significantly reduced by coating the frozen-hydrated sample with a 5-10-nm-thick carbon layer. Since this layer covers up surface details, the sample is first… CONTINUE READING
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