Double Node Upsets Hardened Latch Circuits

@article{Li2015DoubleNU,
  title={Double Node Upsets Hardened Latch Circuits},
  author={Yuanqing Li and Haibin Wang and Suying Yao and Xi Yan and Zhiyuan Gao and Jiangtao Xu},
  journal={J. Electronic Testing},
  year={2015},
  volume={31},
  pages={537-548}
}

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