Don't cares based dynamic test vector compaction in SAT-ATPG

@article{Habib2014DontCB,
  title={Don't cares based dynamic test vector compaction in SAT-ATPG},
  author={Kareem Habib and Mona Safar and Mohamed Dessouky and Ashraf Salem},
  journal={2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)},
  year={2014},
  pages={213-217}
}
SAT solvers have been used as ATPG solution due to the advantage of transforming the circuit to a mathematical problem that can quickly be solved rather than using traditional circuit based approach. In this paper, we present a novel technique for dynamically compacting the test vector set in SAT-based ATPG as it searches for individual vectors, hence giving out fewer patterns that cover more faults. Three-valued encoding was used to allow the use of don't cares, a value that is not part of the… CONTINUE READING

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