Distance dependence of electron tunneling through self-assembled monolayers measured by conducting probe atomic force microscopy: Unsaturated versus saturated molecular junctions

@inproceedings{Wold2002DistanceDO,
  title={Distance dependence of electron tunneling through self-assembled monolayers measured by conducting probe atomic force microscopy: Unsaturated versus saturated molecular junctions},
  author={David J. Wold and Rainer Haag and Maria Anita Rampi and C. Daniel Frisbie},
  year={2002}
}
Electron tunneling through self-assembled monolayers (SAMs) composed of either unsaturated or saturated molecules was investigated using conducting probe atomic force microscopy (CP-AFM). SAMs of unsaturated oligophenylene thiolates or saturated alkanethiolates were assembled on Au substrates and contacted with a Au-coated AFM tip at constant applied load. The current−voltage (I−V) characteristics of both types of SAMs were linear over ±0.3 V. Resistance (R) increased exponentially with… CONTINUE READING

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