Discovering signature patterns from event logs

  title={Discovering signature patterns from event logs},
  author={R. P. Jagadeesh Chandra Bose and Wil M. P. van der Aalst},
  journal={2013 IEEE Symposium on Computational Intelligence and Data Mining (CIDM)},
More and more information about processes is recorded in the form of so-called “event logs”. High-tech systems such as X-ray machines and high-end copiers provide their manufacturers and services organizations with detailed event data. Larger organizations record relevant business events for process improvement, auditing, and fraud detection. Traces in such event logs can be classified as desirable or undesirable (e.g., faulty or fraudulent behavior). In this paper, we present a comprehensive… CONTINUE READING
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