Directional-hemispherical reflectance for spectralon by integration of its bidirectional reflectance.

@article{Haner1998DirectionalhemisphericalRF,
  title={Directional-hemispherical reflectance for spectralon by integration of its bidirectional reflectance.},
  author={David A Haner and B. T. McGuckin and Robert T. Menzies and Carol J. Bruegge and Val{\'e}rie Duval},
  journal={Applied optics},
  year={1998},
  volume={37 18},
  pages={3996-9}
}
The directional-hemispherical reflectance is obtained for Spectralon, the material chosen for onboard radiometric calibration of the multiangle imaging spectroradiometer, at laser wavelengths of 442, 632.8, and 859.9 nm. With p- and s-polarized incident light and for an angle of incidence of 45 degrees , the bidirectional reflectance distribution function was measured over a polar angle range of 1-85 degrees and a range of azimuthal angles of 0-180 degrees in 10 degrees increments. The… CONTINUE READING