Direct imaging of the atomic structure inside a nanowire by scanning tunnelling microscopy

@article{Mikkelsen2004DirectIO,
  title={Direct imaging of the atomic structure inside a nanowire by scanning tunnelling microscopy},
  author={Anders Mikkelsen and Niklas Sk{\"o}ld and Lassana Ouattara and M. Borgstr{\"o}m and Jesper N{\o}rgaard Andersen and Lars A. Samuelson and William John Seifert and Edvin Lundgren},
  journal={Nature Materials},
  year={2004},
  volume={3},
  pages={519-523}
}
Semiconductor nanowires are expected to be important components in future nano-electronics and photonics1,2. Already a wide range of applications has been realized, such as high-performance field-effect transistors3, bio/chemical sensors4, diode logics5,6 and single-nanowire lasers7. As nanowires have small cross-sections and large surface-to-bulk ratios, their properties can be significantly influenced by individual atomic-scale structural features3,7,8,9, and they can have properties9 or even… CONTINUE READING
BETA

Topics from this paper.

Citations

Publications citing this paper.

Similar Papers

Loading similar papers…