Direct deformation study of AFM probe tips modified by hydrophobic alkylsilane self-assembled monolayers.

Abstract

The in-use wear of atomic force microscopy (AFM) probe tips is crucial for the reliability of AFM measurements. Increase of tip size for several nanometers is difficult to monitor but it can already taint subsequent AFM data. We have developed a method to study the shape evolution of AFM probe tips in nanometer scale. This approach provides direct… (More)
DOI: 10.1016/j.ultramic.2011.03.020

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