Digital test text caters for academia and researchers: Hideo Fujiwara 'Logic testing and design for testability' MIT Press, Cambridge, MA, USA (1985) £34.95 pp x + 284

  • Ben Bennetts
  • Published 1986 in
    Microprocessors and Microsystems - Embedded…

Abstract

For reasons that escape me, there is a shortage of books on digital testing. Nobody now denies that the subject is just as important as digital design and yet books on design must outnumber books on testing by at least 20 to one. A new book on testing is therefore an event which should be heralded with due ceremony, provided it contributes to the topic in… (More)
DOI: 10.1016/0141-9331(86)90101-8

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