Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI


Aging induced degradation mechanisms occurring in digital circuits are of a greater importance in the latest technologies. Monotonic degradation such as Bias Temperature Instability (BTI) or Hot Carrier Injection (HCI) but also sudden degradation such as Dielectric Breakdown (DB) are identified as the major sources of reliability hazard. The impact of these… (More)


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