Digital Recognition Based on Image Device Meters

@article{Bin2010DigitalRB,
  title={Digital Recognition Based on Image Device Meters},
  author={Ma Bin and Meng Xiang-bin and Ma Xiaofu and Li Wu-feng and Hao Linchong and Jiang De-an},
  journal={2010 Second WRI Global Congress on Intelligent Systems},
  year={2010},
  volume={3},
  pages={326-330}
}
Analysis the characteristics of meter digital structure, considering the complexity of the meter digital images background, combines dynamic threshold and global threshold binary image on instrument digital image pre-processing. Locating the digital on the instrument, eliminated pattern noise by opening operation and removed small adhesions between the digital and the border, utilized the connected domain screening method to fulfill the meter digital precision positioning. Discussed recognition… CONTINUE READING

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