Digital Integrated Circuit Testing using Transient Signal Analysis

@inproceedings{Plusquellic1996DigitalIC,
  title={Digital Integrated Circuit Testing using Transient Signal Analysis},
  author={James F. Plusquellic and Donald M. Chiarulli and Steven P. Levitan},
  booktitle={ITC},
  year={1996}
}
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test points. W e present simulation and hardware experiments which show distinguishable characteristics between the transient waveforms of defective and non-defective devices. These variations are shown to exist for CMOS open drain and bridging defects, located both on and off of a sensitized path. 
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