Diffusion of Ag into organic semiconducting materials: a combined analytical study using transmission electron microscopy and X-ray reflectivity.

@article{Fladischer2012DiffusionOA,
  title={Diffusion of Ag into organic semiconducting materials: a combined analytical study using transmission electron microscopy and X-ray reflectivity.},
  author={Stefanie Fladischer and Alfred Neuhold and Elke Kraker and Thomas Haber and Bernhard Lamprecht and Ingo Salzmann and Roland Resel and W. Grogger},
  journal={ACS applied materials & interfaces},
  year={2012},
  volume={4 10},
  pages={5608-12}
}
This study shows that the morphology of organic/metal interfaces strongly depends on process parameters and the involved materials. The interface between organic n-type blocking layer materials and the top Ag cathode within an organic photodiode was investigated. Ag was deposited on either amorphous tris-8-hydroxyquinolinato-aluminum (Alq(3)) or crystalline 4,7-diphenyl-1,10-phenanthroline (Bphen) using different deposition techniques such as electron beam deposition, ion beam sputtering, and… CONTINUE READING