Differential Interference Contrast For X-Ray Microscopy: Fabrication And Characterization Of Twin Zone Plate Optics

@inproceedings{Fabrizio2002DifferentialIC,
  title={Differential Interference Contrast For X-Ray Microscopy: Fabrication And Characterization Of Twin Zone Plate Optics},
  author={Enzo Di Fabrizio and Burkhard Kaulich and Thomas Wilhein and J. R. Susini},
  year={2002}
}
A novel X-ray technique for converting the phase information of weakly absorbing specimen into strong image contrast similar to Nomarski differential interference contrast (DIC) is presented. DIC for X-rays is accomplished by the fabrication of a novel X-ray optic (TZP) consisting of two zone plates (ZPs) on both sides of the same substrate, laterally shifted by about one outermost zone width. The feasibility of DIC for X-rays was proven at the ID 21 X-ray microscopy beamline at the ESRF using… CONTINUE READING

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