Dielectric powders X-ray crystallography using rietveld refinement

  • Lidia Dobrescu
  • Published 2014 in
    2014 29th International Conference on…
This paper presents an accurate method to determine the atomic and molecular structure of crystal nanomaterials based on X-ray crystallography. Rietveld refinement using EXPO2009 Software has been applied to improve the results. Six different powder samples have been studied.