Dielectric functions of a growing silver film determined using dynamic in situ spectroscopic ellipsometry.

Abstract

The dielectric functions of plasma deposited silver on SiO2 through all stages of Volmer-Weber growth at room temperature and 150 degrees C were determined unambiguously by applying a model-independent inversion method to dynamic in situ spectroscopic ellipsometric data. The results show large differences in the localized plasmon resonance and the… (More)

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