Dielectric Characterization by Microwave Cavity Perturbation Corrected for Nonuniform Fields

@article{Orloff2014DielectricCB,
  title={Dielectric Characterization by Microwave Cavity Perturbation Corrected for Nonuniform Fields},
  author={Nathan D. Orloff and Jan Obrzut and Christian J. Long and Thomas Lam and Pavel Kabos and David R. Novotny and James C. Booth and J Alexander Liddle},
  journal={IEEE Transactions on Microwave Theory and Techniques},
  year={2014},
  volume={62},
  pages={2149-2159}
}
Nonuniform fields decrease the accuracy of dielectric characterization by microwave cavity perturbation. These fields are due to the slot in the cavity through which the sample is inserted and the boundary between the sample and the metallic walls inside of the cavity. To address this problem, we measured the natural frequency and damping ratio of a resonant cavity as a sample is inserted into the rectangular cavity. We found that for a range of cavity filling fractions, a linear regression on… CONTINUE READING

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References

Publications referenced by this paper.
Showing 1-10 of 38 references

Unified equations for the slope, intercept, and standard errors of the best straight line

D. York, N. M. Evensen, M. L. Martinez, J. D. Delgado
Amer. J. Phys., vol. 72, no. 3, pp. 367–375, Mar. 2004. • 2004
View 5 Excerpts
Highly Influenced

Determination of dielectric constant and loss of high- thin films in the microwave frequencies,”Measurement

K. Sudheendran, D. Pamu, M. G. Krishna, K.C.J. Raju
vol. 43, • 2010
View 4 Excerpts
Highly Influenced

Full-wave analysis of a split-cylinder resonator for nondestructive permittivity measurements

M. D. Janezic, J. Baker-Jarvis
IEEE Trans. Microw. Theory Techn., vol. 47, no. 10, pp. 2014–2020, Oct. 1999. • 2014
View 1 Excerpt

Techniques for measuring the microwave dielectric properties of materials

U. Kaatze
Metrologia, vol. 47, no. 2, pp. S91–S113, Apr. 2010. • 2010

Broadband measurements of dielectric properties of low-loss materials at high temperatures using circular cavity method

E. Li, Z. Nie, +3 authors F. He
Progr. Electromagn. Res., vol. 92, pp. 103–120, 2009. • 2009
View 2 Excerpts

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