Dielectric Characterization by Microwave Cavity Perturbation Corrected for Nonuniform Fields

  title={Dielectric Characterization by Microwave Cavity Perturbation Corrected for Nonuniform Fields},
  author={Nathan D. Orloff and Jan Obrzut and Christian J. Long and Thomas Lam and Pavel Kabos and David R. Novotny and James C. Booth and J Alexander Liddle},
  journal={IEEE Transactions on Microwave Theory and Techniques},
Nonuniform fields decrease the accuracy of dielectric characterization by microwave cavity perturbation. These fields are due to the slot in the cavity through which the sample is inserted and the boundary between the sample and the metallic walls inside of the cavity. To address this problem, we measured the natural frequency and damping ratio of a resonant cavity as a sample is inserted into the rectangular cavity. We found that for a range of cavity filling fractions, a linear regression on… CONTINUE READING


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