Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs

@article{Li2005DiagnosisOR,
  title={Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs},
  author={Chien-Mo James Li and Edward J. McCluskey},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
  year={2005},
  volume={24},
  pages={1748-1759}
}
A resistive-open defect is an imperfect circuit connection that can be modeled as a defect resistor between two circuit nodes that should be connected. A stuck-open (SOP) defect is a complete break (no current flow) between two circuit nodes that should be connected. Conventional single stuck-at fault diagnosis cannot precisely diagnose these two defects because the test results of defective chips depend on the sequence of test patterns. This paper presents precise diagnosis techniques for… CONTINUE READING
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