Diagnosis of delay faults due to resistive bridges, delay variations and defects

  title={Diagnosis of delay faults due to resistive bridges, delay variations and defects},
  author={Lei Wang and S. Gupta and M. A. Breuer},
  journal={2006 15th Asian Test Symposium},
In this paper, we present the first diagnosis algorithm for combinational circuit blocks that considers all combinations of multiple gate/wire delay variations/defects and any single resistive bridge. One key component of the proposed algorithm is a new path-oriented effect-cause procedure to identify all possible suspects of above type that might have caused the timing errors observed during test. The second key component is an efficient data structure to represent the suspects. The third key… CONTINUE READING
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