Diagnosis of Local Spot Defects in Analog Circuits

  title={Diagnosis of Local Spot Defects in Analog Circuits},
  author={Ke Huang and Haralampos-G. D. Stratigopoulos and Salvador Mir and Camelia Hora and Yizi Xing and Bram Kruseman},
  journal={IEEE Transactions on Instrumentation and Measurement},
We present a method for diagnosing local spot defects in analog circuits. The method aims to identify a subset of defects that are likely to have occurred and suggests to give them priority in a classical failure analysis. For this purpose, the method relies on a combination of multiclass classifiers that are trained using data from fault simulation. The method is demonstrated on an industrial large-scale case study. The device under consideration is a controller area network transceiver used… CONTINUE READING
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