Diagnose Multiple Stuck-at Scan Chain Faults

Abstract

Prior effect-cause based chain diagnosis algorithms suffer from accuracy and performance problems when multiple stuck-at faults exist on the same scan chain. In this paper, we propose new chain diagnosis algorithms based on dominant fault pair to enhance diagnosis accuracy and efficiency. Several heuristic techniques are proposed, which include (1) double… (More)
DOI: 10.1109/ETS.2008.20

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Cite this paper

@article{Huang2008DiagnoseMS, title={Diagnose Multiple Stuck-at Scan Chain Faults}, author={Yu Huang and Wu-Tung Cheng and Ruifeng Guo}, journal={2008 13th European Test Symposium}, year={2008}, pages={105-110} }