Di erentiation between tracks and damages in SSNTD under the atomic force microscope

@inproceedings{Ho2003DiEB,
  title={Di erentiation between tracks and damages in SSNTD under the atomic force microscope},
  author={Joan P. Y. Ho and Chun Wing Yip and D. Nikezic and K. N. Yu},
  year={2003}
}
We have observed three-dimensional sponge-like structures as well as strips of connecting pits on the surface of the LR 115 detector after etching, which can be confused with the small tracks formed after short etching time. We have employed an atomic force microscope (AFM) to study these “damages” as well as genuine alpha tracks for short etching time. It… CONTINUE READING