Device landing zone calcification and its impact on residual regurgitation after transcatheter aortic valve implantation with different devices.

@article{Seiffert2016DeviceLZ,
  title={Device landing zone calcification and its impact on residual regurgitation after transcatheter aortic valve implantation with different devices.},
  author={Moritz Seiffert and Buntaro Fujita and Maxim Avanesov and Clemens Lunau and Gerhard MSc Sch{\"o}n and Lenard Conradi and Emir Prashovikj and Smita Scholtz and Jochen Boergermann and Werner Scholtz and Ulrich Sch{\"a}fer and Gunnar Lund and Stephan M. Ensminger and Hendrik Treede},
  journal={European heart journal cardiovascular Imaging},
  year={2016},
  volume={17 5},
  pages={
          576-84
        }
}
AIMS Calcification of the device landing zone is linked to paravalvular regurgitation after transcatheter aortic valve implantation (TAVI). The mechanisms remain incompletely understood and the performance of next-generation transcatheter heart valves (THV) has not been investigated. We evaluated the impact of calcification patterns on residual aortic regurgitation (AR) after TAVI with different THV in patients with severe aortic stenosis. METHODS AND RESULTS TAVI was performed in 537… CONTINUE READING
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