Development of visual inspection system for detecting surface defects on sensor chip

  title={Development of visual inspection system for detecting surface defects on sensor chip},
  author={Adi Nurhadiyatna and Sven Loncaric and Esa Prakasa and Edi Kurniawan and A. A. Khoirudin and Luciano Musa and Petra Reidler},
  journal={2017 International Conference on Computer, Control, Informatics and its Applications (IC3INA)},
This paper presents a visual inspection method based on image processing techniques. The method aims to detect surface defects found on pixel chip pads. Pixel chip is a tiny sensor used in Inner Tracking System (ITS) — a large particle detector of ALICE experiment (A Large Ion Collider Experiment). The chips record particle trajectories after collision event in the ITS system. In a mass production stage, the chip quality needs to be accurately inspected and assessed to ensure its technical… CONTINUE READING


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Showing 1-10 of 11 references

Computer-aided visual inspection of surface defects in ceramic capacitor chips

Journal of Materials Processing Technology, vol. 189, pp. 19–25, 2007. • 2007
View 4 Excerpts
Highly Influenced

Implementation on 3D surface algorithm for measuring thickness parameter of sensor chip

2015 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS) • 2015
View 1 Excerpt

DeepFace: Closing the Gap to Human-Level Performance in Face Verification

2014 IEEE Conference on Computer Vision and Pattern Recognition • 2014
View 1 Excerpt

Technical design report for the upgrade of the alice inner tracking system

B. A. et al, T. A. Collaboration
Journal of Physics G: Nuclear and Particle Physics, vol. 41, no. 08, p. 087002, 2014. • 2014
View 1 Excerpt

Boosted Gabor Features Applied to Vehicle Detection

18th International Conference on Pattern Recognition (ICPR'06) • 2006
View 1 Excerpt

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