Development of in situ analyzer of field emission devices

@article{Kawasaki2009DevelopmentOI,
  title={Development of in situ analyzer of field emission devices},
  author={Michito Kawasaki and Zhen He and Yasuhito Gotoh and Hiroshi Tsuji and Junzo Ishikawa},
  journal={2009 22nd International Vacuum Nanoelectronics Conference},
  year={2009},
  pages={123-124}
}
The characteristics of field emission devices operated in low-vacuum state, for example in Field Emission Display (FED), fluctuate depending on the variation of surface state of the field emitter. Therefore, the analysis of the property of field emission devices by Fowller-Nordheim plot (FN plot) is generally difficult. In order to analyze field emission… CONTINUE READING