Development of high-speed ion conductance microscopy.

  title={Development of high-speed ion conductance microscopy.},
  author={Shinji Watanabe and Satoko Kitazawa and Linhao Sun and Noriyuki Kodera and Toshio Ando},
  journal={The Review of scientific instruments},
  volume={90 12},
Scanning ion conductance microscopy (SICM) can image the surface topography of specimens in ionic solutions without mechanical probe-sample contact. This unique capability is advantageous for imaging fragile biological samples but its highest possible imaging rate is far lower than the level desired in biological studies. Here, we present the development of high-speed SICM. The fast imaging capability is attained by a fast Z-scanner with active vibration control and pipette probes with enhanced… 

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