Determining the refractive index and thickness of thin films from prism coupler measurements.

Abstract

A simple method of determining thin film parameters from mode indices measured using a prism coupler is described. The problem is reduced to doing two least squares straight line fits through measured mode indices vs effective mode number. The slope and y intercept of the line are simply related to the thickness and refractive index of film, respectively… (More)
DOI: 10.1364/AO.20.002085

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