Determining the carrier-envelope offset frequency of 5-fs pulses with extreme nonlinear optics in ZnO.

@article{Mcke2002DeterminingTC,
  title={Determining the carrier-envelope offset frequency of 5-fs pulses with extreme nonlinear optics in ZnO.},
  author={Oliver D M{\"u}cke and Thorsten Tritschler and Martin Wegener and Uwe Morgner and Franz X. K{\"a}rtner},
  journal={Optics letters},
  year={2002},
  volume={27 23},
  pages={2127-9}
}
We excite ZnO samples with two-cycle optical pulses directly from a mode-locked oscillator with average powers of several tens of milliwatts. The emitted light reveals peaks at the carrier-envelope offset frequency f(ø) and at 2f(ø) in the radio-frequency spectra. These peaks can still be detected in layers as thin as 350 nm-a step toward determining the carrier-envelope offset phase itself.