Determination of the thickness and optical constants of transparent indium-doped ZnO thin films by the envelope method

@inproceedings{Ilican2007DeterminationOT,
  title={Determination of the thickness and optical constants of transparent indium-doped ZnO thin films by the envelope method},
  author={Saliha Ilican and Mujdat Caglar and Yasemin Çağlar},
  year={2007}
}
Transparent indium-doped ZnO thin films were deposited by the spray pyrolysis method onto glass substrates. The content of indium in the starting solution was 0.5 at. %. The crystallographic structure of the film was studied by X-ray diffraction (XRD). XRD measurement shows that the film is crystallized in the wurtzite phase and presents a preferential orientation along the c-axis. The texture coefficient (TC), grain size value and lattice constants have been calculated. The absorption… CONTINUE READING

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