Determination of the Goos-Hänchen shift in dielectric waveguides via photo emission electron microscopy in the visible spectrum.

Abstract

Photoemission Electron Microscopy (PEEM) is a versatile tool that relies on the photoelectric effect to produce high-resolution images. Pulse lasers allow for multi-photon PEEM where multiple photons are required excite a single electron. This non-linear process can directly image the near field region of electromagnetic fields in materials. We use this… (More)
DOI: 10.1364/OE.24.003839

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