Determination of the Complex Permittivity Values of Planar Dielectric Substrates by means of a Multifrequency PSO-based Technique

In this paper, an innovative technique for the determination of the dielectric properties of planar substrates is presented. Starting from a set of impedance measurements performed on a section of a microstrip transmission line built on the planar dielectric substrate under test, the proposed technique formulates the reconstruction problem in terms of an… (More)