Determination of localized visibility in off-axis electron holography.

Abstract

Off-axis electron holography is a wavefront-split interference method for the transmission electron microscope that allows the phase shift and amplitude of the electron wavefront to be separated and quantitatively measured. An additional, third component of the holographic signal is the coherence of the electron wavefront. Historically, wavefront coherence… (More)
DOI: 10.1016/j.ultramic.2013.11.005

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Cite this paper

@article{Mcleod2014DeterminationOL, title={Determination of localized visibility in off-axis electron holography.}, author={R A Mcleod and Martin Kupsta and Marek Malac}, journal={Ultramicroscopy}, year={2014}, volume={138}, pages={4-12} }