Determination of Optical Constants of Solgel-Derived Inhomogeneous TiO(2) Thin Films by Spectroscopic Ellipsometry and Transmission Spectroscopy.

Abstract

Amorphous and nanocrystalline TiO(2) thin films coated on a vitreous silica substrate by a solgel dip coating method are investigated for optical properties by spectroscopic ellipsometry (SE) together with transmission spectroscopy. A method of analysis of SE data to determine the degree of inhomogeneity of TiO(2) films has also been presented. Instead of… (More)

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