Detection of Transient Faults in Nanometer Technologies by using Modular Built-In Current Sensors

@inproceedings{Torres2013DetectionOT,
  title={Detection of Transient Faults in Nanometer Technologies by using Modular Built-In Current Sensors},
  author={Frank Torres and Rodrigo Possamai Bastos},
  year={2013}
}
CMOS is furthermore the most widespread technology for integrated designs as no feasible alternative is in sight to date and in the near future. Driving forces of this leadership are the high miniaturization capability and the reliability of CMOS. Against the background of nanotechnology though, reliability concerns are arising with an alarming pace. The shrinking of technology sizes result in circuits that are more susceptible to several permanent or transient error sources like oxide… CONTINUE READING

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