Detection and Characterization of Isolated and Overlapping Spots

  title={Detection and Characterization of Isolated and Overlapping Spots},
  author={Herke Jan Noordmans and Arnold W. M. Smeulders},
  journal={Computer Vision and Image Understanding},
A systematic approach is presented to detect and characterize isolated and overlapping spots. In defining spots as image details without inner structure, the analysis reduces to the determination of their location, intensity, size, and possibly orientation. The detection phase consists of matching a spot model to all image positions. The characterization phase consists of searching the best matching model for each spot. Both matching procedures are based on weighted image matching, where the… CONTINUE READING
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