Detecting signals of new technological opportunities using semantic patent analysis and outlier detection

@article{Yoon2011DetectingSO,
  title={Detecting signals of new technological opportunities using semantic patent analysis and outlier detection},
  author={Janghyeok Yoon and Kwangsoo Kim},
  journal={Scientometrics},
  year={2011},
  volume={90},
  pages={445-461}
}
In the competitive business environment, early identification of technological opportunities is crucial for technology strategy formulation and research and development planning. There exist previous studies that identify technological directions or areas from a broad view for technological opportunities, while few studies have researched a way to detect distinctive patents that can act as new technological opportunities at the individual patent level. This paper proposes a method of detecting… CONTINUE READING
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Wordnet-based semantic similarity measurement. http://www.codeproject

  • T. Simpson, T. Dao
  • 2005
Highly Influential
4 Excerpts

Patent-based inventor profiles as a basis for human

  • M. Moehrle, L. Walter, A. Geritz, S. Muller
  • 2005
Highly Influential
5 Excerpts

On the development of a technology intelligence tool for identifying technology opportunity

  • J. Yoon, S. Choi, K. Kim
  • Expert Systems with Applications
  • 2011
3 Excerpts

Elements of good practice for providers of publicly funded patent

  • A. Radauer, L. Walter
  • 2010
3 Excerpts

Elements of good practice for providers of publicly funded patent information services for SMEs - selected and amended results of a benchmarking exercise

  • P. Resnik
  • World Patent Information
  • 2010

Patent function network analysis : A function based approach for analyzing patent information

  • S. Choi, J. Lim, J. Yoon, K. Kim
  • 2010
1 Excerpt

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