Design of sub-10-picoseconds on-chip time measurement circuit

  title={Design of sub-10-picoseconds on-chip time measurement circuit},
  author={M. Amir Abas and Gordon Russell and David Kinniment},
  journal={Proceedings Design, Automation and Test in Europe Conference and Exhibition},
  pages={804-809 Vol.2}
The rapid pace of change in IC technology, specifically in speed of operation, demands sophisticated design solutions for IC testing methodologies. Moreover, the current technology of System-on-chip (SOC) makes great demands for testing internal speed accurately as the limitation on accessing internal nodes using I/O pins becomes more difficult. This paper presents two highresolution time measurement schemes for digital BIST applications, namely: Two-Delay Interpolation Method (TDIM) and Time… CONTINUE READING
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