Design of a High speed Built-in Repair Analyser for Word-Oriented Memories

Abstract

Here we introduced a new method called Built in self-repair analyzer for the memory arrays. In this detection of errors is done by a single test. By performing the must-repair analysis on the fly during the test, it selectively stores fault addresses, and the final analysis is performed on the stored fault addresses to find a solution. The memory required… (More)

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