Design for Testability Design Test Test Development Failure Diagnosis the Multiple Facets of Dft Figure 1. Closing the Dft Gap

  • Tom Lecklider

Abstract

enough. However, the complications associated with IP from different sources, having incompatible test strategies and requiring several types of testers, make a difficult situation nearly impossible. The answer is to build at least some of the test hardware on-chip. Ideally, a DFT technology should scale to larger devices so that common test approaches can… (More)

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