Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50 mm.

Abstract

A phantom has been used to position two radiation sources, separately, when buried under dry-silica sand at depths between 5 and 50 mm. A γ-ray energy spectrum was then measured at every 1 mm depth. Principal component analysis has been conducted, which has led to a non-linear fit being established, allowing the depth of entrainment to be accurately… (More)
DOI: 10.1016/j.apradiso.2011.11.033

Topics

Cite this paper

@article{Adams2012DepthP1, title={Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50 mm.}, author={Jamie C. Adams and Malcolm John Joyce and Matthew Mellor}, journal={Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine}, year={2012}, volume={70 7}, pages={1150-3} }