Dependence of plasmon polaritons on the thickness of indium tin oxide thin films

@article{Rhodes2008DependenceOP,
  title={Dependence of plasmon polaritons on the thickness of indium tin oxide thin films},
  author={C. Rhodes and M. Cerruti and A. Efremenko and Mark D Losego and D. E. Aspnes and J. Maria and S. Franz{\'e}n},
  journal={Journal of Applied Physics},
  year={2008},
  volume={103},
  pages={093108}
}
  • C. Rhodes, M. Cerruti, +4 authors S. Franzén
  • Published 2008
  • Materials Science
  • Journal of Applied Physics
  • The evolution of polariton features with increasing thickness in p-polarized (TM) reflectance spectra of indium tin oxide (ITO) thin films deposited on BK7 glass reveals the nature of plasmons in conducting thin films without interference from band-to-band transitions or the tendency of very thin films to form islands, both of which are complicating factors with the noble metals Au and Ag. Although the dependence on energy, film thickness, and angle of incidence is complex, these features are… CONTINUE READING
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