Demystifying Iddq Data With Process Variation for Automatic Chip Classification

@article{Chang2015DemystifyingID,
  title={Demystifying Iddq Data With Process Variation for Automatic Chip Classification},
  author={Chia-Ling Chang and Charles H.-P. Wen},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  year={2015},
  volume={23},
  pages={1175-1179}
}
  • Chia-Ling Chang, Charles H.-P. Wen
  • Published in
    IEEE Transactions on Very…
    2015
  • Computer Science
  • Iddq testing is an integral component of test suites for the screening of unreliable devices. As the scale of silicon technology continues shrinking, Iddq values and associated fluctuations increase. In addition, increased design complexity makes defect-induced leakage currents difficult to differentiate from full-chip currents. Consequently, traditional Iddq methods result in more test escapes and yield loss. This brief proposes a new test method, called σ-Iddq to provide the following: 1… CONTINUE READING

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