Demonstrating reliability growth requirements with confidence

@article{Crow2012DemonstratingRG,
  title={Demonstrating reliability growth requirements with confidence},
  author={Larry H. Crow},
  journal={2012 Proceedings Annual Reliability and Maintainability Symposium},
  year={2012},
  pages={1-6}
}
  • L. H. Crow
  • Published 3 April 2012
  • Engineering
  • 2012 Proceedings Annual Reliability and Maintainability Symposium
Reliability growth testing is used to find reliability problems in the system design through testing so that effective corrective actions can be taken to improve the reliability. In addition, many systems are subjected to a follow-on reliability demonstration test and the results are typically compared to a reliability requirement. The expectation is that by conducting the reliability growth test the probability of passing the demonstration test is improved. While this is generally true for the… 

Reliability growth test planning of repairable systems using subsystem failure distribution data

  • M. Awad
  • Engineering
    2015 International Conference on Industrial Engineering and Systems Management (IESM)
  • 2015
Reliability growth testing has been widely used for assessing the reliability of complex systems in the automotive, aerospace, and oil and gas industry. The traditional common and practiced approach

An Approach for Reliability Demonstration Test Based on Power‐Law Growth Model

TLDR
This paper examines a comprehensive test plan that involves information concerning the reliability growth stage and proposes an approach under the assumption of the power-law model that combines data related to the growth stage with those pertaining to the test stage of the product to reduce the cost of the test.

Economic allocation of reliability growth testing using Weibull distributions

  • M. Awad
  • Engineering
    Reliab. Eng. Syst. Saf.
  • 2016

Reliability Demonstration for Long-Life Products Based on Degradation Testing and a Wiener Process Model

TLDR
In this paper, the degradation based reliability demonstration test (RDT) plan design problems for long life products under a small sample circumstance are studied and the superiority of degradation based RDT methods compared with the traditional failure based methods is shown.

Review on Software and Hardware Reliability and Metrics

TLDR
How software metrics can improve the reliability and quality of the software product can be improved by applying software metrics at each of these development phases is discussed.

An Examination of Statistical Rigor Infused into the KC-46 Flight Test program

TLDR
This project will examine the planned test program for KC-46 and reconsider components of that program based on principles of statistical rigor and use of the Weibull failure distribution as a more general framework to provide additional insight about the failure profile of the component or system.

References

SHOWING 1-6 OF 6 REFERENCES

Reliability Analysis for Complex, Repairable Systems

Abstract : The reliability of a complex system that is repaired (but not replaced) upon failure will often depend on the system chronological age. If only minimal repair is made so that the intensity

An Extension to the Weibull Process Model

Abstract : A system testing program may consist of two kinds of test phases: those in which system configuration is continually modified to reduce the frequency of failures and those in which system

Confidence Interval Procedures for Reliability Growth Analysis

Abstract : The Weibull Process (a nonhomogeneous Poisson process with intensity r(t) = lambda beta t (beta-1)) is considered as a stochastic model for the Duane reliability growth postulate. Under

Confidence Interval Procedures for the Weibull Process With Applications to Reliability Growth

The Weibull Process (a nonhomogeneous Poisson process with intensity r(t) = λβt β−1) is considered as a stochastic model for the Duane (1964) reliability growth postulate. Under this model the mean

Learning Curve Approach to Reliability Monitoring

  • J. T. Duane
  • Engineering
    IEEE Transactions on Aerospace
  • 1964
Several different and complex electromechanical and mechanical systems are shown to have remarkably similar rates of reliability improvement during system development. These similarities provide the

Inferences on the Parameters and Current System Reliability for a Time Truncated Weibull Process

Conditional inference procedures are discussed for the shape parameter and for the current system reliability for a time truncated Weibull process. These tests are shown to be uniformly most powerful