Delay defect screening using process monitor structures

  title={Delay defect screening using process monitor structures},
  author={Subhasish Mitra and Erik H. Volkerink and Edward J. McCluskey and Stefan Eichenberger},
  journal={22nd IEEE VLSI Test Symposium, 2004. Proceedings.},
This paper presents delay test data collected from test chips fabricated in a 0.18 /spl mu/ technology. The experimental data shows that process monitor structures such as on-chip ring oscillators are effective in identifying slow parts while performing transition fault testing at frequencies slower than the rated frequency. 
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