Delay defect screening using process monitor structures

  title={Delay defect screening using process monitor structures},
  author={S. Mitra and Erik H. Volkerink and E. McCluskey and S. Eichenberger},
  journal={22nd IEEE VLSI Test Symposium, 2004. Proceedings.},
  • S. Mitra, Erik H. Volkerink, +1 author S. Eichenberger
  • Published 2004
  • Computer Science
  • 22nd IEEE VLSI Test Symposium, 2004. Proceedings.
  • This paper presents delay test data collected from test chips fabricated in a 0.18 /spl mu/ technology. The experimental data shows that process monitor structures such as on-chip ring oscillators are effective in identifying slow parts while performing transition fault testing at frequencies slower than the rated frequency. 

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