Delay defect diagnosis methodology using path delay measurements

  title={Delay defect diagnosis methodology using path delay measurements},
  author={Eun Jung Jang and Jaeyong Chung and Jacob A. Abraham},
  journal={2011 International Symposium on Integrated Circuits},
With aggressive device scaling, timing failures have become more prevalent due to manufacturing defects and process variations. When timing failure occurs, it is important to take corrective actions immediately. Therefore, an efficient and fast diagnosis method is essential. In this paper, we propose a new diagnostic method using timing information. Our method approximately estimates all the segment delays of measured paths in a design using inequality-constrained least squares methods. Then… CONTINUE READING