Degradation-based burn-in with preventive maintenance

@article{Ye2012DegradationbasedBW,
  title={Degradation-based burn-in with preventive maintenance},
  author={Zhisheng Ye and Yan Shen and Min Xie},
  journal={European Journal of Operational Research},
  year={2012},
  volume={221},
  pages={360-367}
}
As many products are becoming increasingly more reliable, traditional lifetime-based burn-in approaches that try to fail defective units during the test require a long burn-in duration, and thus are not effective. Therefore, we promote the degradation-based burn-in approach that bases the screening decision on the degradation level of a burnt-in unit. Motivated by the infant mortality faced by many Micro-ElectroMechanical Systems (MEMSs), this study develops two degradation-based joint burn-in… CONTINUE READING
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A burn-in scheme based on percentiles

  • Z. S. Ye, L. C. Tang, M. Xie
  • 2011
Highly Influential
6 Excerpts

Advances in Degradation Modeling: Applications to Reliability. Survival Analysis, and Finance

  • M. S. Nikulin, N. Limnios, N. Balakrishnan
  • 2009
Highly Influential
6 Excerpts

Replacement Models with Minimal Repair

  • J. H. Cha, M. Finkelstein
  • 2010
Highly Influential
4 Excerpts

The optimal burn-in: state of the art and new advances for cost function formulation. In: Recent Advances in Reliability and Quality in Design

  • X. Liu, T. A. Mazzuchi
  • 2008
Highly Influential
4 Excerpts

Optimal burn-in policy by using an integrated

  • S. T. Tseng, C. Y. Peng
  • 2004
Highly Influential
4 Excerpts

A burn - in scheme based on percentiles of the residual life

  • Z. S. Ye, L. C. Tang, M. Xie
  • Journal of Quality Technology
  • 2011
1 Excerpt

A survey of burn-in and maintenance models for repairable systems

  • Holt, Rinehart, Winston, J. H. New York. Cha
  • 2011

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