Defining and Testing Dynamic Adc Parameters

  • Tanja C. Hofner
  • Published 2000


NOVEMBER 2000 75 This short article series will conclude next month with insights into the practical aspects of dynamic performance testing. Note that some specifications allow more than one approach for measurement and even for definition. Thus, the test techniques of Part 2 represent one approach, but are not mandatory. Any of the methods described can be extended or altered as necessary to suit the application at hand. When testing high-speed ADCs, one emulates the operation of an instrument used to quantify linearity in analog circuits—the spectrum analyzer. For this instrument and for the test procedure, dynamic specifications are usually expressed in the frequency domain, using the Fast Fourier transform (FFT). In both cases, the data output represents the magnitude of this FFT. As an example (Fig. 1), consider the FFT plot for an 80-MSamples/s, 10-b ADC designed and optimized for ultrasound imaging and the digitization of baseband/IF signals. These FFT plots contain impressive amounts of information, and they can be quickly generated. But to make use of an FFT, one must understand how its parameters are defined. For a waveform perfectly reconDESIGN FEATURE

Cite this paper

@inproceedings{Hofner2000DefiningAT, title={Defining and Testing Dynamic Adc Parameters}, author={Tanja C. Hofner}, year={2000} }