Defects in Microelectronic Materials and Devices, Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf (Eds.). Taylor and Francis Group LLC, Boca Raton, FL, USA

@article{Amin2009DefectsIM,
  title={Defects in Microelectronic Materials and Devices, Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf (Eds.). Taylor and Francis Group LLC, Boca Raton, FL, USA},
  author={Ahmed Amin},
  journal={Microelectronics Reliability},
  year={2009},
  volume={49},
  pages={821-822}
}

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